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Nanowall formation by maskless wet-etching on a femtosecond laser irradiated silicon surface
[Display omitted] •High aspect ratio nanowalls with micro-cells were fabricated by laser assisted wet-etching process.•The surface roughness of micro-cells was 3.10 nm on average.•Nanowalls improved the lateral growth of thin film phase penetacene layer by size confining effect. We found that micro-...
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Published in: | Applied surface science 2018-04, Vol.437, p.190-194 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | [Display omitted]
•High aspect ratio nanowalls with micro-cells were fabricated by laser assisted wet-etching process.•The surface roughness of micro-cells was 3.10 nm on average.•Nanowalls improved the lateral growth of thin film phase penetacene layer by size confining effect.
We found that micro-cells surrounded by nanowalls can be formed by a maskless wet-etching process on Si (100) surfaces possessing Laser Induced Periodic Surface Structure (LIPSS) by femtosecond laser irradiation. The LIPSS process could produce periodic one-dimensional micron scale ripples on a Si surface, which could be developed into micro-cells by a subsequent etching process. The solution etching conditions strongly affected both the micro-cell and nanowall shapes such as the height and the thickness of nanowalls. The tetramethylammonium hydroxide solution created thin nanowalls and the resulting micro-cells with a well-flattened bottom while the KOH solution formed thick walls and incomplete micro-cells. The bottoms of micro-cells surrounded by the nanowalls were considerably flat with a 3.10 nm surface roughness. A pentacene layer was deposited on the micro-cells of a Si surface to evaluate the film properties by grazing incidence wide angle x-ray scattering measurements. The pentacene film on the micro-cell Si surface showed a strong film phase, which was comparable to the film phase grown on the atomically flat Si surface. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2017.12.155 |