Influence of the grain structure of yttria thin films on the hydrogen isotope permeation

• Published in: International journal of hydrogen energy 2018-12, Vol.43 (51), p.22976-22985
• Main Authors: Engels, J., Houben, A., Hansen, P., Rasinski, M., Linsmeier, Ch
• Format: Article
• Language: English
• Subjects: Deuterium; Grain boundary density; Microstructure; Tritium permeation barrier
• ISSN: 0360-3199; 1879-3487
• DOI: 10.1016/j.ijhydene.2018.09.191

Steel components are required in the infrastructure and the facilities of the hydrogen economy. The high hydrogen pressures in the hydrogen economy lead to embrittlement and surface corrosion of the steels. For the functionality of the facilities it is necessary to suppress the embrittlement and the surface corrosion of the steels by protective layers, e.g. ceramic thin films. With regard to fusion power plants ceramic thin films on the structural steel materials are also required. These thin films work as a tritium permeation barrier that is necessary to prevent the loss of the radioactive fuel inventory. Oxide thin films, e.g. Al2O3, Er2O3, and Y2O3, are promising candidates as tritium permeation barrier layers. In terms of the application in the first wall, this is especially true for yttrium due to its favorably short decay time after neutron activation compared to the other candidates. The Y2O3 layers with thicknesses of 0.5 μm–1 μm are deposited on both substrate sides by RF magnetron sputter deposition. Since the microstructure of the barrier layer plays an important role for the permeation reduction, layers with three different magnetron process modes and thus three different microstructures are prepared. After annealing the cubic crystal structure of all thin films is verified by X-ray diffraction and the different microstructures are investigated by scanning electron microscopy and transmission electron microscopy. The Y2O3 stoichiometry of all thin films and a chromium oxide material segregation at the interface are verified by analysis methods such as X-ray photoelectron spectroscopy. The permeation reduction factors of all thin films are determined in gas-driven deuterium permeation experiments. Corresponding to the three different microstructures, reduction factors of 25, 45, and 1100 are identified. Thus, the permeation reduction is strongly dependent on the Y2O3 microstructure. The measurement results suggest that a high density of grain boundaries leads to a high hydrogen permeation. •All Y2O3 thin films show the same stoichiometry and feature a similar cubic phase after annealing.•For over 2 weeks the permeation reduction of all thin films is stable or slightly increasing.•No sample shows damage formation due to the annealing in the measurements.•3 different Y2O3 microstructures correspond to the reduction factors of 25, 45, and 1100.•The grain boundary diffusion through the thin films is preferred.