Pattern formation for a charge transfer model with cross-diffusion

This paper is devoted to a charge transfer model with cross-diffusion under Neumann boundary conditions. By applying the linear stability theory, sufficient conditions for the occurrence of Hopf bifurcation and Turing instability are successfully established. Moreover, the amplitude equations are de...

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Bibliographic Details
Published in:Journal of mathematical analysis and applications 2024-10, Vol.538 (1), p.128334, Article 128334
Main Authors: Guo, Gaihui, You, Jing, Wei, Meihua, Su, Youhui
Format: Article
Language:English
Subjects:
Amplitude equation
Charge transfer model
Cross-diffusion
Turing bifurcation
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Summary:This paper is devoted to a charge transfer model with cross-diffusion under Neumann boundary conditions. By applying the linear stability theory, sufficient conditions for the occurrence of Hopf bifurcation and Turing instability are successfully established. Moreover, the amplitude equations are derived near the critical value of Turing instability according to the standard multiple-scale analysis. Our research indicates that the entire pattern generated by this model is controlled by the cross-diffusion parameter d21. Dynamic pattern formation is described theoretically and numerically, such as changing control parameters for spot pattern, strip pattern, and spot-strip pattern.
ISSN:0022-247X
1096-0813
DOI:10.1016/j.jmaa.2024.128334