Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

The performances of organic (opto)electronic devices strongly depend on the order at the supramolecular level. Unraveling the relationship between structural and electronic properties in nanoscale architectures is therefore key for both fundamental studies and technological applications. C-AFM and K...

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Bibliographic Details
Published in:Materials today (Kidlington, England) England), 2014-12, Vol.17 (10), p.504-517
Main Authors: Musumeci, Chiara, Liscio, Andrea, Palermo, Vincenzo, Samorì, Paolo
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Materials
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Summary:The performances of organic (opto)electronic devices strongly depend on the order at the supramolecular level. Unraveling the relationship between structural and electronic properties in nanoscale architectures is therefore key for both fundamental studies and technological applications. C-AFM and KPFM provide an immediate correlation between the morphology of a material and its electrical/electronic properties such as local conductivity and surface potential. Thus, they are unrivaled techniques offering crucial information toward the optimization of the real devices, ultimately providing an important contribution to a hot field at the cross-road between nanoscience and organic (opto)electronics. Herein we focus on the application of C-AFM and KPFM on self-assembled monolayers (SAMs), organic (semi)conducting materials for thin film transistors (TFTs) and organic blends for photovoltaics (OSCs).
ISSN:1369-7021
1873-4103
DOI:10.1016/j.mattod.2014.05.010