The materials science beamline at the Swiss Light Source: design and realization

The Materials Science Beamline at the Swiss Light Source (SLS) has been designed to produce hard X-rays in the photon-energy range 5–40 keV, at an intermediate energy (2.4 GeV) synchrotron. To this end, it employs a novel “minigap wiggler”. Important issues in the design and realization of the beaml...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2005-03, Vol.540 (1), p.42-67
Main Authors: Patterson, B.D., Abela, R., Auderset, H., Chen, Q., Fauth, F., Gozzo, F., Ingold, G., Kühne, H., Lange, M., Maden, D., Meister, D., Pattison, P., Schmidt, Th, Schmitt, B., Schulze-Briese, C., Shi, M., Stampanoni, M., Willmott, P.R.
Format: Article
Language:English
Subjects:
Materials science
Synchrotron radiation
Tomography
X-ray diffraction
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Summary:The Materials Science Beamline at the Swiss Light Source (SLS) has been designed to produce hard X-rays in the photon-energy range 5–40 keV, at an intermediate energy (2.4 GeV) synchrotron. To this end, it employs a novel “minigap wiggler”. Important issues in the design and realization of the beamline are the high heat load, robust system design, flexibility of operation and user-friendliness. A conventional collimating-mirror/sagittally focusing double-crystal monochromator/focusing mirror optics has been chosen with approximately 1:1 symmetry. Established component designs have been used wherever possible. Three serial end-stations are served with X-rays. Besides the minigap wiggler, other novel or unusual features are: continuous “top-up” injection in the SLS storage-ring, a rotating carbon “cup” filter in the beamline front-end, angles and bending radii of the optics mirrors which are adjusted at each change in photon-energy and special experimental-station equipment including high-speed one- and two-dimensional semiconductor detectors for powder and surface diffraction and a two-dimensional “Bragg magnifier” for tomography. In this work, a comparison is made between predicted and measured beamline properties, and Appendices with useful formulae and algorithms are provided.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2004.11.018