Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2007-11, Vol.582 (1), p.182-184
• Main Authors: Lee, J.H., Almer, J., Aydιner, C., Bernier, J., Chapman, K., Chupas, P., Haeffner, D., Kump, K., Lee, P.L., Lienert, U., Miceli, A., Vera, G.
• Format: Article
• Language: English
• Subjects: Flat panel detector; Pair distribution function; Stress–strain measurement
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2007.08.103

Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm 2 with 200×200 μm 2 pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate −8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode—make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.