X-ray characterization of surfaces irradiated with highly charged ions

Highly charged ions (HCI) approaching, touching or penetrating dielectric surfaces extract many electrons of the solid leading to the formation of permanent surface modifications. The ions which capture the electrons in their outermost shells form hollow atoms which emit X-rays during their decay to...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2009-02, Vol.267 (4), p.665-668
Main Authors: Briand, J.P., Benhachoum, M.
Format: Article
Language:English
Subjects:
Highly charged ions
Hollow atoms
Surface diagnostics
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Summary:Highly charged ions (HCI) approaching, touching or penetrating dielectric surfaces extract many electrons of the solid leading to the formation of permanent surface modifications. The ions which capture the electrons in their outermost shells form hollow atoms which emit X-rays during their decay to the ground state. In this paper one presents experiments showing that these X-rays) allow diagnosing the electric nature of the surfaces. HCI while modifying the structure of surfaces may then also be used to diagnose these changes on line or off line.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2008.11.050