Single- and multiparametric luminescence cryogenic thermometry using ZnTe/CdTe layers

• Published in: Optical materials 2024-03, Vol.149, p.114978, Article 114978
• Main Authors: Borisov, Evgenii V., Kalinichev, Alexey A., Kolesnikov, Ilya E.
• Format: Article
• Language: English
• Subjects: CdTe; Cryogenic temperature; Luminescence thermometry; Multiple linear regression; ZnTe
• ISSN: 0925-3467; 1873-1252
• DOI: 10.1016/j.optmat.2024.114978

Temperature sensing in the cryogenic range is highly demanded in many advanced scientific applications and technologies. Luminescence thermometry provides remote temperature reading via the monitoring the chosen optical parameter. However, to widen the usage of luminescence thermometers, their performances should be improved. Here, multiparameteric luminescence thermometry using multiple linear regression was proposed and compared with conventional single-parameter sensing. Thermal studies were performed with ZnTe epitaxial layers with submonolayer CdTe inclusions, which allows providing temperature monitoring within 20–100 K. Simultaneous use of LIR, spectral position and bandwidth results in more than 10 times increase of relative sensitivity compared with conventional single-parameter thermometry. Thus, the unprecedently high Sr = 60 % K−1@25K was obtained via multiparametric thermal sensing, which makes such strategy perspective for further improvement of thermometric performances. •ZnTe/CdTe sample was successfully utilized as cryogenic luminescence thermal sensor.•Single-parameter sensing was based on monitoring LIR, line position and bandwidth.•Multiparametric thermal sensing was realized using multiple linear regression.•Multiparametric approach enhanced sensitivity more than 10 times to 60 % K−1@25K.