Heavy‐ion beam probe diagnostic systems (invited)

Heavy‐ion beam probing generally consists of passing a beam of 1+ ions through a plasma imbedded in a magnetic field. Secondary ions with higher ionization levels are produced by ionizing collisions with the plasma electrons. Detection of the secondary ions with a small‐aperture electrostatic energy...

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Bibliographic Details
Published in:Review of scientific instruments 1988-08, Vol.59 (8), p.1646-1651
Main Authors: Schoch, P. M., Carnevali, A., Conner, K. A., Crowley, T. P., Forster, J. C., Hickok, R. L., Lewis, J. F., Schatz, J. G., Hallock, G. A.
Format: Article
Language:English
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Summary:Heavy‐ion beam probing generally consists of passing a beam of 1+ ions through a plasma imbedded in a magnetic field. Secondary ions with higher ionization levels are produced by ionizing collisions with the plasma electrons. Detection of the secondary ions with a small‐aperture electrostatic energy analyzer allows continuous fluctuation measurements of the plasma density and space potential with both spatial and temporal resolution. Spatial resolution is the order of 0.1 cm3 and temporal resolution is presently electronics limited to ∼1 μs. The energy of the probing beam is determined primarily by the requirement that the secondary ion must escape from the plasma. Typical beam energies extend from 10 to 500 keV. The range of plasma densities that have been investigated is 101 2 cm− 3
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1140270