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Energy loss analyses of amorphous magnetic ribbons by multi-frequency single sheet tester

Due to low values of both thickness and conductivity, Fe-based amorphous soft magnetic ribbon (AR) is an attractive alternative to crystalline silicon steel (CS) for elevated frequencies f up to several kHz. On the other hand, for corresponding tests of losses P, the only standardized method is rest...

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Bibliographic Details
Published in:AIP advances 2024-03, Vol.14 (3), p.035111-035111-12
Main Authors: Pfützner, Helmut, Shilyashki, Georgi, Bengtsson, Claes
Format: Article
Language:English
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Summary:Due to low values of both thickness and conductivity, Fe-based amorphous soft magnetic ribbon (AR) is an attractive alternative to crystalline silicon steel (CS) for elevated frequencies f up to several kHz. On the other hand, for corresponding tests of losses P, the only standardized method is restricted to just 400 Hz. Recently, we reported “Physically Consistent Loss Testing” (CLT) for loss tests of CS for f up to 10 kHz. Here, we describe an adaptation of a corresponding multi-frequency single sheet tester for AR-applications. The CS single sheet is replaced by six 50 cm long and 17 cm wide ARs, loosely inserted into a paper envelope. This “envelope technique” provides (i) simple sample arrangement in an absolutely flat state, (ii) high repeatability, (iii) robust sensor signals, (iv) avoidance of loss increases due to magneto-mechanical effects, and (v) averaging over thickness variations of ARs through as much as 100 g of sample mass. Here, we report the results of frequency analyses for sinusoidal magnetization in the longitudinal direction for induction up to 1.5 T for f < 1 kHz and 0.4 T for 10 kHz, with P up to 50 W/kg. Anisotropy tests confirm a very weak dominance of the transverse direction. In conclusion, CLT proves to be an effective tool for loss tests on both CS and AR as a physically consistent principle. Therefore, for the ongoing standardization of SST with H-coil, we recommend considering the integration of the “envelope technique” in order to establish rapid and universal multi-frequency loss testing.
ISSN:2158-3226
2158-3226
DOI:10.1063/5.0177921