Subnanometric stabilization of plasmon-enhanced optical microscopy

We have demonstrated subnanometric stabilization of tip-enhanced optical microscopy under ambient condition. Time-dependent thermal drift of a plasmonic metallic tip was optically sensed at subnanometer scale, and was compensated in real-time. In addition, mechanically induced displacement of the ti...

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Bibliographic Details
Published in:Nanotechnology 2012-05, Vol.23 (20), p.205503-205503
Main Authors: Yano, Taka-aki, Ichimura, Taro, Kuwahara, Shota, Verma, Prabhat, Kawata, Satoshi
Format: Article
Language:English
Subjects:
Displacement
Equipment Design
Equipment Failure Analysis
Image Enhancement - instrumentation
Microscopy, Scanning Probe - instrumentation
Nanoindentation
Nanoparticles - ultrastructure
Nanotechnology
Nanotechnology - instrumentation
Optical microscopy
Plasmonics
Real time
Reproducibility
Stabilization
Surface Plasmon Resonance - instrumentation
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Summary:We have demonstrated subnanometric stabilization of tip-enhanced optical microscopy under ambient condition. Time-dependent thermal drift of a plasmonic metallic tip was optically sensed at subnanometer scale, and was compensated in real-time. In addition, mechanically induced displacement of the tip, which usually occurs when the amount of tip-applied force varies, was also compensated in situ. The stabilization of tip-enhanced optical microscopy enables us to perform long-time and robust measurement without any degradation of optical signal, resulting in true nanometric optical imaging with high reproducibility and high precision. The technique presented is applicable for AFM-based nanoindentation with subnanometric precision.
ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/23/20/205503