Deconvolution of morphological texture from crystallographic texture data

• Published in: Journal of applied crystallography 2002-06, Vol.35 (3), p.327-337
• Main Authors: Langelaan, Gijs, Delannay, Laurent, Verpoest, Ignaas, Van Houtte, Paul
• Format: Article
• Language: English
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Dispersion-, fiber-, and platelet-reinforced metal-based composites; Exact sciences and technology; Materials science; Metals. Metallurgy; morphological texture function; orientation distribution function; Other materials; Physics; Single-crystal and powder diffraction; Specific materials; Structure of solids and liquids; crystallography; texture analysis; X-ray diffraction and scattering
• ISSN: 1600-5767; 0021-8898; 1600-5767
• DOI: 10.1107/S0021889802004168

The physical properties of composite materials reinforced with fibres usually depend significantly on the orientation distribution of these fibres. The goal of this study is to develop a technique to measure the orientation distribution of second‐phase particles which in themselves have a strong crystallographic texture. This permits the well known methods of pole‐figure measurements to be used and the deconvolution of the `morphological texture function' from these data. In the current paper, the deconvolution procedure is presented and validated by simulations. Finally, the procedure is applied to an experimental system, which further confirms the validity of the approach. The simulations convoluted a morphological texture function with a crystallographic texture using a discrete representation of the orientation distribution function (ODF). After the convolution, the resulting ODF was converted to a series‐expansion representation, which then permitted the deconvolution by an independent method. The results of the deconvolution return the original MTF, hence validating the procedure derived. The experimental system measured the crystallographic texture of 316L stainless‐steel yarns woven into a fabric. The crystallographic texture obtained from straight yarns was used as the reference texture. The X‐ray diffraction measurements reveal the weave pattern but with some ghosting errors. These are attributed to an insufficient measurement volume, which could be overcome by using radiation with a greater penetration, such as neutrons.