Scattering effects of electric and magnetic field probes

Many electromagnetic measurements of electromagnetic pulse (EMP) interactions with electronic systems use B-dot and D-dot probes. The effects of the measurement probe on the field distribution being measured is considered. An infrared measurement technique is used to determine the field distribution...

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Bibliographic Details
Published in:IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) 1989-12, Vol.36 (6), p.2050-2057
Main Authors: Norgard, J.D., Sega, R.M., Harrison, M., Pesta, A., Seifert, M.
Format: Article
Language:English
Subjects:
440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems
DISTURBANCES
ELECTROMAGNETIC FIELDS
Electromagnetic measurements
Electromagnetic propagation
Electromagnetic scattering
EMP radiation effects
FIELD TESTS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Magnetic field measurement
Magnetic separation
Measurement techniques
MEASURING INSTRUMENTS
Microwave propagation
PROBES
RADIATION EFFECTS
Resonant frequency
SCATTERING
TESTING
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Summary:Many electromagnetic measurements of electromagnetic pulse (EMP) interactions with electronic systems use B-dot and D-dot probes. The effects of the measurement probe on the field distribution being measured is considered. An infrared measurement technique is used to determine the field distributions with and without the presence of electric- or magnetic-field probes. Two-dimensional thermogram images of the scattered field patterns are measured. The scattering effects of various probes in the frequency range from 1 to 10 GHz are presented. This frequency range can be used to scale-model many EMP and high-power microwave (HPM) effects. It is shown that wide variations in the response of a probe can occur due to resonant frequency and mutual-coupling effects. These effects are due, in part, to the different measurement configurations of the probe relative to the direction of propagation and polarization of the incident electromagnetic wave to be measured. These differences can be significant at certain frequencies and separation distances for the various probe measurement configurations.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.45404