Silicon Field Emission Electron Source With Individually Controllable Single Emitters

• Published in: IEEE transactions on electron devices 2021-08, Vol.68 (8), p.4116-4122
• Main Authors: Lawrowski, Robert, Hausladen, Matthias, Buchner, Philipp, Schreiner, Rupert
• Format: Article
• Language: English
• Subjects: Arrays; Borosilicate glass; Cathodes; Circuits; Current distribution; current limiters; Current measurement; Electric potential; electron emission; Electron sources; Emitters; Emitters (electron); Field emission; Glass substrates; Integrals; Laser machining; Micromachining; Regulation; Self alignment; Silicon; silicon-on-insulator; Surface emitting lasers; Tips; Vacuum chambers; Voltage; Voltage measurement
• ISSN: 0018-9383; 1557-9646
• DOI: 10.1109/TED.2021.3093374

An electron source with an array of individually controllable single tips allows the observation of each emitter current simultaneously as well as the measurement of the integral current. Furthermore, the initial activation process of the individual tips and current distribution of the source can be examined. The Si cathode consists of an array of 2\times2 conically shaped emitter structures on a borosilicate glass substrate. The emitters were fabricated by laser micromachining and wet etching. Integral field emission (FE) measurements were performed in a diode configuration in a vacuum chamber at pressures of about 10 −9 mbar with a self-aligned Si extraction grid, due to adjustment pins. The total emission current was regulated to a predefined value (4.0, 10, 20, 40, and 50 \mu \text{A} ) by an external regulating circuit and recorded individually during the measurement. The onset voltage for a current of 1 nA varied between 320 and 430 V. The voltage conversion factor is in the range of 7.6\times 10^{{4}} cm −1 to 1.3\times 10^{{5}} cm −1 . Constant current measurements over a longer period of time (1800 values with a sample rate of 0.5 Hz) were performed and show a total current fluctuation less than 0.6% due to the regulation circuit. Despite the stable total current in regulated operation, it was observed that the individual emitters fluctuate up to 75% for low (~10 −8 A) and 5% for high (~10 −5 A) currents.