Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey

Currently, deep learning-based visual inspection has been highly successful with the help of supervised learning methods. However, in real industrial scenarios, the scarcity of defect samples, the cost of annotation, and the lack of a priori knowledge of defects may render supervised-based methods...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2022, Vol.71, p.1-21
Main Authors: Tao, Xian, Gong, Xinyi, Zhang, Xin, Yan, Shaohua, Adak, Chandranath
Format: Article
Language:English
Subjects:
Algorithms
Annotations
Anomalies
Anomaly localization (AL)
Autonomous aerial vehicles
Deep learning
Defects
Feature extraction
Image reconstruction
Image segmentation
industrial inspection
Inspection
literature survey
Localization
Location awareness
Machine learning
Performance assessment
Semantics
Taxonomy
Technical information
unsupervised learning
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Summary:Currently, deep learning-based visual inspection has been highly successful with the help of supervised learning methods. However, in real industrial scenarios, the scarcity of defect samples, the cost of annotation, and the lack of a priori knowledge of defects may render supervised-based methods ineffective. In recent years, unsupervised anomaly localization (AL) algorithms have become more widely used in industrial inspection tasks. This article aims to help researchers in this field by comprehensively surveying recent achievements in unsupervised AL in industrial images using deep learning. The survey reviews more than 120 significant publications covering different aspects of AL, mainly covering various concepts, challenges, taxonomies, benchmark datasets, and quantitative performance comparisons of the methods reviewed. In reviewing the achievements to date, this article provides detailed predictions and analysis of several future research directions. This review provides detailed technical information for researchers interested in industrial AL and who wish to apply it to the localization of anomalies in other fields.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2022.3196436