The Identification of a Quantative Trait Loci-Allele System of Antixenosis against the Common Cutworm (Spodoptera litura Fabricius) at the Seedling Stage in the Chinese Soybean Landrace Population

Common cutworm (CCW) is an omnivorous insect causing severe yield losses in soybean crops. The seedling-stage mini-tray identification system with the damaged leaf percentage (DLP) as an indicator was used to evaluate antixenosis against CCW in the Chinese soybean landrace population (CSLRP) under t...

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Bibliographic Details
Published in:International journal of molecular sciences 2023-11, Vol.24 (22), p.16089
Main Authors: Pan, Lin, Gai, Junyi, Xing, Guangnan
Format: Article
Language:English
Subjects:
Alleles
Animals
Chromosomes
Crops
Genes
Genome-Wide Association Study
Germplasm
Glycine max - genetics
Identification
Phenotype
Plant Breeding
Plant resistance
Polymorphism, Single Nucleotide
Quantitative genetics
Seedlings - genetics
Seeds
Soybean
Soybeans
Spodoptera - genetics
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