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Phase-dependent microwave response of a graphene Josephson junction

Gate-tunable Josephson junctions embedded in a microwave environment provide a promising platform to in situ engineer and optimize novel superconducting quantum circuits. The key quantity for the circuit design is the phase-dependent complex admittance of the junction, which can be probed by sensing...

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Bibliographic Details
Published in:Physical review research 2022-03, Vol.4 (1), p.013198, Article 013198
Main Authors: Haller, R., Fülöp, G., Indolese, D., Ridderbos, J., Kraft, R., Cheung, L. Y., Ungerer, J. H., Watanabe, K., Taniguchi, T., Beckmann, D., Danneau, R., Virtanen, P., Schönenberger, C.
Format: Article
Language:English
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Summary:Gate-tunable Josephson junctions embedded in a microwave environment provide a promising platform to in situ engineer and optimize novel superconducting quantum circuits. The key quantity for the circuit design is the phase-dependent complex admittance of the junction, which can be probed by sensing a radio frequency SQUID with a tank circuit. Here, we investigate a graphene-based Josephson junction as a prototype gate-tunable element enclosed in a SQUID loop that is inductively coupled to a superconducting resonator operating at 3 GHz. With a concise circuit model that describes the dispersive and dissipative response of the coupled system, we extract the phase-dependent junction admittance corrected for self-screening of the SQUID loop. We decompose the admittance into the current-phase relation and the phase-dependent loss, and as these quantities are dictated by the spectrum and population dynamics of the supercurrent-carrying Andreev bound states, we gain insight to the underlying microscopic transport mechanisms in the junction. We theoretically reproduce the experimental results by considering a short, diffusive junction model that takes into account the interaction between the Andreev spectrum and the electromagnetic environment, from which we estimate lifetimes on the order of ∼10 ps for nonequilibrium populations.
ISSN:2643-1564
2643-1564
DOI:10.1103/PhysRevResearch.4.013198