Inverse design of color routers in CMOS image sensors: toward minimizing interpixel crosstalk

Over the past decade, significant advancements in high-resolution imaging technology have been driven by the miniaturization of pixels within image sensors. However, this reduction in pixel size to submicrometer dimensions has led to decreased efficiency in color filters and microlens arrays. The de...

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Bibliographic Details
Published in:Nanophotonics (Berlin, Germany) Germany), 2024-07, Vol.13 (20), p.3895-3914
Main Authors: Lee, Sangbin, Hong, Jaehyun, Kang, Joonho, Park, Junjeong, Lim, Jaesung, Lee, Taeho, Jang, Min Seok, Chung, Haejun
Format: Article
Language:English
Subjects:
adjoint optimization
Boundary conditions
Color
color routing
crosstalk
Design optimization
Efficiency
Image filters
Image resolution
image sensor
Incident waves
Inverse design
Microlenses
Miniaturization
Pixels
Routers
Sensor arrays
Sensors
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Summary:Over the past decade, significant advancements in high-resolution imaging technology have been driven by the miniaturization of pixels within image sensors. However, this reduction in pixel size to submicrometer dimensions has led to decreased efficiency in color filters and microlens arrays. The development of color routers that operate at visible wavelengths presents a promising avenue for further miniaturization. Despite this, existing color routers often encounter severe interpixel crosstalk, around 70 %, due to the reliance on periodic boundary conditions. Here, we present interpixel crosstalk-minimized color routers that achieve an unprecedented in-pixel optical efficiency of 87.2 % and significantly reduce interpixel crosstalk to 2.6 %. The color routers are designed through adjoint optimization, incorporating customized incident waves to minimize interpixel crosstalks. Our findings suggest that our color router design surpasses existing color routing techniques in terms of in-pixel optical efficiency, representing a crucial step forward in the push toward commercializing the next generation of solid-state image sensors.
ISSN:2192-8614
2192-8606
2192-8614
DOI:10.1515/nanoph-2024-0269