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Electro‐optic modulator based on vanadium dioxide epsilon‐near‐zero nanorods embedded in silicon slot waveguide
We present an electro‐optic modulator exploiting a metamaterial made of an array of vanadium dioxide nanorods operating in epsilon‐near‐zero regime as the active switching material in a silicon waveguide. The modulator takes advantage of the insulator‐to‐metal transition of vanadium dioxide along wi...
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Published in: | Nano select 2023-05, Vol.4 (5), p.346-352 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We present an electro‐optic modulator exploiting a metamaterial made of an array of vanadium dioxide nanorods operating in epsilon‐near‐zero regime as the active switching material in a silicon waveguide. The modulator takes advantage of the insulator‐to‐metal transition of vanadium dioxide along with near‐zero effective permittivity to achieve a modulation depth of 19.7 dB µm–1 in a footprint of 1.6 µm × 1 µm over a broad range of wavelengths. Using simulations, we demonstrate how the effective permittivity of the metamaterial can be tuned to a near‐zero value by varying the nanorod geometry to increase the modulation depth. The paper further investigates a novel hexagonal array design using the metamaterial nanorods to obtain a lower insertion loss and high modulation depth. The results provide insight into the design of ultra‐compact epsilon‐near‐zero modulators with high operation frequencies and low insertion losses.
A metamaterial modulator consisting of vanadium dioxide nanorods operating in the epsilon‐near‐zero regime has been demonstrated and studied with a high modulation depth and broad wavelength of operation. The modulator achieves a modulation depth of 19.7 dB µm–1 and a hexagonal array design is investigated for low insertion loss applications. The results provide insights into the design of compact epsilon‐near‐zero modulators with high operation frequencies. |
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ISSN: | 2688-4011 2688-4011 |
DOI: | 10.1002/nano.202200258 |