Picosecond Demodulation and Coherent Electron Beams

Fourier theory states that a time domain signal can be represented in the frequency domain with no loss of information. Because of this equivalence, it is possible to make frequency domain measurements on a signal and, using Fourier theory, determine the time domain parameters of the source. These p...

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Bibliographic Details
Main Authors: Swartz, John C, Guenther, Bob D, Casey, H. C., Jr
Format: Report
Language:English
Subjects:
AUTOCORRELATION
CHARGE DENSITY
COHERENCE
DEMODULATION
ELECTRON BEAMS
ELECTRON BUNCHES
FIELD THEORY
FOURIER SPECTROMETERS
FOURIER TRANSFORMATION
FREE ELECTRON LASERS
FREQUENCY DOMAIN
LASER BEAMS
Lasers and Masers
LINEAR ACCELERATORS
MILLIMETER WAVES
OPTICAL INTERFEROMETERS
OPTIMIZATION
PARAMETERS
Particle Accelerators
PASSIVE SYSTEMS
PICOSECOND TIME
POWER SPECTRA
REAL TIME
RELATIVISTIC ELECTRONS
RELATIVITY THEORY
SHORT PULSES
SUBMILLIMETER WAVES
THERMIONIC EMISSION
TIME DOMAIN
TIME SIGNALS
WAVEGUIDES
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Summary:Fourier theory states that a time domain signal can be represented in the frequency domain with no loss of information. Because of this equivalence, it is possible to make frequency domain measurements on a signal and, using Fourier theory, determine the time domain parameters of the source. These principles form the basis for using frequency domain measurements to characterize the real time operational characteristics of the relativistic electron beam of a free electron laser (FEL). By using a Fourier transform spectrometer (FTS) to measure the millimeter/sub-millimeter spectrum emitted by a pulsed relativistic electron beam, the temporal electron beam pulse duration and shape are characterized. This technique is used to measure a 1.3 picosecond relativistic electron bunch. In addition, we are able to resolve changes in electron bunch characteristics between the beginning and end of a train of bunches. Preliminary work has begun correlating electron pulse shape to FEL optical operation. Finally, variations in the controls of the electron beam system are correlated with changes in the electron bunch measured usin the FTS. Unlike other techniques that destructively interact with the electron beam, this technique is totally passive and results in negligible perturbation in the electron bunch; hence this technique can be used for direct real-time non-destructive