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Study of radiation tolerance of Cu(In,Ga)Se2 detector

A Cu(In,Ga)Se2 (CIGS) semiconductor has been widely developed as a solar cell. It is known to have a radiation damage recovery mechanism brought about by a process of thermal annealing. We investigated the radiation damage recovery mechanism though two irradiation experiments at HIMAC and CYRIC. In...

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Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2024-10, Vol.1067, Article 169637
Main Authors: Itabashi, K., Fujii, S., Imura, M., Isobe, T., Miyahara, M., Nishinaga, J., Okumura, H., Togawa, M.
Format: Article
Language:English
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Summary:A Cu(In,Ga)Se2 (CIGS) semiconductor has been widely developed as a solar cell. It is known to have a radiation damage recovery mechanism brought about by a process of thermal annealing. We investigated the radiation damage recovery mechanism though two irradiation experiments at HIMAC and CYRIC. In the HIMAC experiment, a 2 μm-thick CIGS detector was irradiated with a 400 MeV/u Xe ion (132Xe+54) beam, and the collected charge from Xe signal was observed. After Xe beam irradiation with a dose of 0.6 MGy, collected charge from the Xe beam was deteriorated to 51% of initial state. However, it recovered to 97% after 2 h dark annealing at 130 °C. In the CYRIC experiment, 70 MeV protons with a fluence of 7.5×1015MeVneq/cm2 were irradiated to CIGS solar cells. After dark annealing at 130 °C for 1 h, a short circuit current density (JSC) recovered from 57% to 85% of the initial state. On the other hand, it took about 34 h for the JSC to recover from 50% to 85% at 90 °C. From these two irradiation experiments, it appeared that the radiation damage recovery mechanism is effective for the CIGS detector, the amount of recovery having a strong dependence on annealing temperature. [Display omitted] •Semiconductor detector’s performances degrade by radiation damage.•A CIGS solar cell has an ability to recover from radiation damage though thermal annealing.•The degradation of collected charge by 132Xe54+ irradiation is recovered by thermal annealing at 130 °C.•The recovery characteristic of radiation damage in CIGS semiconductor is also beneficial for detectors.•The recovery speed of proton irradiation damage in CIGS solar cells strongly depends on the annealing temperature.
ISSN:0168-9002
DOI:10.1016/j.nima.2024.169637