Loading…

Microfocusing of the FERMI@Elettra FEL beam with a K–B active optics system: Spot size predictions by application of the WISE code

FERMI@Elettra, the first seeded EUV-SXR free electron laser (FEL) facility located at Elettra Sincrotrone Trieste has been conceived to provide very short (10–100fs) pulses with ultrahigh peak brightness and wavelengths from 100nm to 4nm. A section fully dedicated to the photon transport and analysi...

Full description

Saved in:
Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2013-05, Vol.710, p.131-138
Main Authors: Raimondi, L., Svetina, C., Mahne, N., Cocco, D., Abrami, A., De Marco, M., Fava, C., Gerusina, S., Gobessi, R., Capotondi, F., Pedersoli, E., Kiskinova, M., De Ninno, G., Zeitoun, P., Dovillaire, G., Lambert, G., Boutu, W., Merdji, H., Gonzalez, A.I., Gauthier, D., Zangrando, M.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:FERMI@Elettra, the first seeded EUV-SXR free electron laser (FEL) facility located at Elettra Sincrotrone Trieste has been conceived to provide very short (10–100fs) pulses with ultrahigh peak brightness and wavelengths from 100nm to 4nm. A section fully dedicated to the photon transport and analysis diagnostics, named PADReS, has already been installed and commissioned. Three of the beamlines, EIS-TIMEX, DiProI and LDM, installed after the PADReS section, are in advanced commissioning state and will accept the first users in December 2012. These beam lines employ active X-ray optics in order to focus the FEL beam as well as to perform a controlled beam-shaping at focus. Starting from mirror surface metrology characterization, it is difficult to predict the focal spot shape applying only methods based on geometrical optics such as the ray tracing. Within the geometrical optics approach one cannot take into account the diffraction effect from the optics edges, i.e. the aperture diffraction, and the impact of different surface spatial wavelengths to the spot size degradation. Both these effects are strongly dependent on the photon beam energy and mirror incident angles. We employed a method based on physical optics, which applies the Huygens–Fresnel principle to reflection (on which the WISE code is based). In this work we report the results of the first measurements of the focal spot in the DiProI beamline end-station and compare them to the predictions computed with Shadow code and WISE code, starting from the mirror surface profile characterization.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2012.11.039