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Sub-pixel detection of laser-induced damage and its growth on fused silica optics using registration residuals
Fused silica optics are key components to manipulate high energy Inertial Confinement Fusion (ICF) laser beams but their optical properties can be degraded by laser-induced damage. The detection of laser damage sites is of major importance. The challenge is to monitor damage initiation and growth at...
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Published in: | Optics express 2021-10, Vol.29 (22), p.35820-35836 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Fused silica optics are key components to manipulate high energy Inertial Confinement Fusion (ICF) laser beams but their optical properties can be degraded by laser-induced damage. The detection of laser damage sites is of major importance. The challenge is to monitor damage initiation and growth at sub-pixel scale with highly sensitive measurements. The damage diameter is a widely used indicator to quantify damage growth but its accuracy is strongly dependent on the available image resolution. More recently, it was shown that registration residual maps ( i.e. , gray level differences between two registered images) could also be used to monitor laser-induced damage. In this paper, the performance of both indicators are compared to detect laser damage initiation and growth at high and low image resolutions thanks to a highly instrumented laser setup. The results prove that registration residual maps are more efficient to detect sub-pixel laser damage growth than diameter measurements at a given image resolution. The registration residual maps are therefore a powerful indicator for monitoring laser-induced damage initiation and growth at sub-pixel scale either for laser damage metrology setups, for high energy laser facilities, or other situations where damage is suspected to occur. The accuracy of (laser-induced) damage laws may also be improved thanks to this tool. |
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ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.433862 |