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Direct observation of highly anisotropic electronic and optical nature in indium telluride
Metal monochalcogenides (MX , M = Ga, In; X = S, Se, Te) offer a large variety of electronic properties depending on chemical composition, number of layers, and stacking order. InTe material has a one-dimensional chain structure, from which intriguing properties arise. Precise experimental determina...
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Published in: | Physical review materials 2023-07, Vol.7 (7), Article 074601 |
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Main Authors: | , , , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Metal monochalcogenides (MX , M = Ga, In; X = S, Se, Te) offer a large variety of electronic properties depending on chemical composition, number of layers, and stacking order. InTe material has a one-dimensional chain structure, from which intriguing properties arise. Precise experimental determination of the electronic structure of InTe is needed for a better understanding of potential properties and device applications. In this study, by combining angle-resolved photoemission spectroscopy and density functional theory calculations, we demonstrate the stability of InTe in the tetragonal crystal structure, with a semiconducting character and an intrinsic p-type doping. The valence band maximum results in being located at the high symmetric M point with a high elliptical valley, manifesting a large effective mass close to the Fermi level. The longitudinal and transverse effective masses of the M valley are measured as 0.2 m 0 and 2 m 0 , respectively. More specifically, we observe that the effective mass of the hole carriers is about ten times larger along the chain direction compared to the perpendicular one. Remarkably, the in-plane anisotropy of effective mass from the experiment and in theoretical calculations are in good agreement. These observations indicate a highly anisotropic character of the electronic band structure, making InTe of interest for electronic and thermoelectric applications. |
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ISSN: | 2475-9953 2475-9953 |
DOI: | 10.1103/PhysRevMaterials.7.074601 |