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Fabrication and Thermal Characterization of Copper Nanowires (CuNWs) Thermal Interface Materials Tapes
High-performing thermal interface material (TIM) that exhibits both high thermal conductivity and high mechanical compliance is a crucial component in modern electronics. This paper specifically focuses on the fabrication and characterization of Copper Nanowires/Polydimethylsiloxane (CuNWs/PDMS) com...
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Main Authors: | , , , , , |
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Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
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Summary: | High-performing thermal interface material (TIM) that exhibits both high thermal conductivity and high mechanical compliance is a crucial component in modern electronics. This paper specifically focuses on the fabrication and characterization of Copper Nanowires/Polydimethylsiloxane (CuNWs/PDMS) composites as a promising TIM. The first section of the paper discusses the shortcomings of existing fabrication methods for CuNWs and proposes a novel on-PCTE evaporative coating method. CuNWs and CuNWs/PDMS of 25-50 gm thick with NW diameter 0.1-0.25 gm and density 107-108 cm -2 were fabricated at a high yield rate. The second part focuses on the thermal characterization of CuNWs, highlighting the source of uncertainty in traditional measurement methods[6] and introducing an approach using TIM testers coupled with Infrared (IR) thermography. In the final section, the paper emphasizes the significance of minimizing dry contact resistance(~10 -4 m 2 KW -1 ) in thermal resistance measurements of CuNWs, which have an expected thermal resistance of ~10 -6 m 2 KW -1 . The paper explores the application of gallium-based liquid metal (LM) to mitigate this issue. The results show promising advancements in characterizing low-resistance TIM materials and concluded that the CuNWs (or CuNWs/PDMS tape) have thermal resistance at least one order of magnitude smaller than 10 -5 m 2 KW -1 . Further investigation into the roughness and material of the LM-wetted surface should be done to improve LM-wetting condition and enhance measurement sensitivity. |
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ISSN: | 2694-2135 |
DOI: | 10.1109/ITherm55375.2024.10709516 |