E-SCOUT: Efficient-Spatial Clustering-based Outlier Detection through Telemetry

Silicon lifecycle management (SLM) is needed to ensure silicon-product reliability and quality. Prior methods utilize off-chip solutions to identify malware, diagnose bugs, and characterize silicon health metrics. These methods do not explore hardware/software codesign for SLM. In this work, we pres...

Full description

Saved in:
Bibliographic Details
Main Authors: Ortega, Eduardo, Talukdar, Jonti, Paik, Woohyun, Su, Fei, Chattopadhyay, Rita, Chakrabarty, Krishnendu
Format: Conference Proceeding
Language:English
Subjects:
Accuracy
Anomaly detection
Data models
Feature extraction
Hardware Telemetry
Image edge detection
Memory-efficient
Outlier Detection
Power demand
Security
Silicon
Silicon Lifecycle Management
System-on-chip
Telemetry
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Silicon lifecycle management (SLM) is needed to ensure silicon-product reliability and quality. Prior methods utilize off-chip solutions to identify malware, diagnose bugs, and characterize silicon health metrics. These methods do not explore hardware/software codesign for SLM. In this work, we present a new method called Efficient-Spatial Clustering-based OUlier detection through Telemetry (E-SCOUT) to monitor a chip's status through performance counters/sensors. E-SCOUT includes a compute- and memory-efficient unsupervised 32-bit floating point outlier detection mechanism implemented on-chip (E-SCOUT edge). In addition, it enhances on-chip outlier detection through unsupervised feature ranking based on the telemetry feature information entropy. We also provide microarchitectural recommendations to enable a hardware/software co-design of E-SCOUT edge. The proposed solution includes an end-to-end outlier-informed diagnosis model with real telemetry data (E-SCOUT cloud). All telemetry data is collected through the model-specific register space using open-source Linux tools and Intel's performance counter monitor. We capture the chip telemetry signatures of the PAMPAR benchmark suite in the presence of outlier events such as security attacks (e.g., Rowhammer and SPECTRE) and voltage droops. E-SCOUT provides effective unsupervised on-chip outlier detection performance with high accuracy levels (over 0.9) and with low area and low power over-head (2.2% die area overhead and 1% idle power consumption). Outlier diagnosis can identify the chip's status with classification accuracy and F1-scores that exceed 0.8.
ISSN:2378-2250
DOI:10.1109/ITC51657.2024.00044