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Test Generation Algorithms for Computer Hardware Description Languages
This paper proposes an extension of the D-algorithm to functions described in computer hardware description languages. The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for...
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Published in: | IEEE transactions on computers 1982-07, Vol.C-31 (7), p.577-588 |
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Main Authors: | , |
Format: | Article |
Language: | English |
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cited_by | cdi_FETCH-LOGICAL-c259t-4e08592cd6a30f699beef07899527a7840b208bf7271f532b80bdaff10f24d363 |
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cites | cdi_FETCH-LOGICAL-c259t-4e08592cd6a30f699beef07899527a7840b208bf7271f532b80bdaff10f24d363 |
container_end_page | 588 |
container_issue | 7 |
container_start_page | 577 |
container_title | IEEE transactions on computers |
container_volume | C-31 |
creator | Levendel Menon |
description | This paper proposes an extension of the D-algorithm to functions described in computer hardware description languages. The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for circuits containing functions described in CHDL's are discussed. The fault modes considered are function variables stuck at 0 or 1, control faults, and function faults with user-specified faulty behaviors. |
doi_str_mv | 10.1109/TC.1982.1676054 |
format | article |
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The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for circuits containing functions described in CHDL's are discussed. The fault modes considered are function variables stuck at 0 or 1, control faults, and function faults with user-specified faulty behaviors.</description><identifier>ISSN: 0018-9340</identifier><identifier>EISSN: 1557-9956</identifier><identifier>DOI: 10.1109/TC.1982.1676054</identifier><identifier>CODEN: ITCOB4</identifier><language>eng</language><publisher>IEEE</publisher><subject>D-algorithm ; functional blocks ; nonprocedural CHDL ; procedural CHDL ; test generation</subject><ispartof>IEEE transactions on computers, 1982-07, Vol.C-31 (7), p.577-588</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c259t-4e08592cd6a30f699beef07899527a7840b208bf7271f532b80bdaff10f24d363</citedby><cites>FETCH-LOGICAL-c259t-4e08592cd6a30f699beef07899527a7840b208bf7271f532b80bdaff10f24d363</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1676054$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids></links><search><creatorcontrib>Levendel</creatorcontrib><creatorcontrib>Menon</creatorcontrib><title>Test Generation Algorithms for Computer Hardware Description Languages</title><title>IEEE transactions on computers</title><addtitle>TC</addtitle><description>This paper proposes an extension of the D-algorithm to functions described in computer hardware description languages. The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for circuits containing functions described in CHDL's are discussed. The fault modes considered are function variables stuck at 0 or 1, control faults, and function faults with user-specified faulty behaviors.</description><subject>D-algorithm</subject><subject>functional blocks</subject><subject>nonprocedural CHDL</subject><subject>procedural CHDL</subject><subject>test generation</subject><issn>0018-9340</issn><issn>1557-9956</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1982</creationdate><recordtype>article</recordtype><recordid>eNpFkEtLw0AUhQdRMFbXLtzkDyS9M8m8liXaVgi4ieswSe7ESPNgJkX89_YRcHUW58HhI-SZQkwp6HWRxVQrFlMhBfD0hgSUcxlpzcUtCQCoinSSwj158P4bAAQDHZBtgX4OdzigM3M3DuHm0I6um796H9rRhdnYT8cZXbg3rvkxDsNX9LXrpks4N0N7NC36R3JnzcHj06Ir8rl9K7J9lH_s3rNNHtWM6zlKERTXrG6EScAKrStEC1KdTjJppEqhYqAqK5mkliesUlA1xloKlqVNIpIVWV93azd679CWk-t6435LCuUZQ1lk5RlDuWA4NV6ujQ4R_9OL-weT3Fjq</recordid><startdate>198207</startdate><enddate>198207</enddate><creator>Levendel</creator><creator>Menon</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>198207</creationdate><title>Test Generation Algorithms for Computer Hardware Description Languages</title><author>Levendel ; Menon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c259t-4e08592cd6a30f699beef07899527a7840b208bf7271f532b80bdaff10f24d363</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1982</creationdate><topic>D-algorithm</topic><topic>functional blocks</topic><topic>nonprocedural CHDL</topic><topic>procedural CHDL</topic><topic>test generation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Levendel</creatorcontrib><creatorcontrib>Menon</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on computers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Levendel</au><au>Menon</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Test Generation Algorithms for Computer Hardware Description Languages</atitle><jtitle>IEEE transactions on computers</jtitle><stitle>TC</stitle><date>1982-07</date><risdate>1982</risdate><volume>C-31</volume><issue>7</issue><spage>577</spage><epage>588</epage><pages>577-588</pages><issn>0018-9340</issn><eissn>1557-9956</eissn><coden>ITCOB4</coden><abstract>This paper proposes an extension of the D-algorithm to functions described in computer hardware description languages. The proposed extension is applicable to both procedural and nonprocedural languages. Methods of D-propagation through the basic constructs of these languages and test generation for circuits containing functions described in CHDL's are discussed. The fault modes considered are function variables stuck at 0 or 1, control faults, and function faults with user-specified faulty behaviors.</abstract><pub>IEEE</pub><doi>10.1109/TC.1982.1676054</doi><tpages>12</tpages></addata></record> |
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ispartof | IEEE transactions on computers, 1982-07, Vol.C-31 (7), p.577-588 |
issn | 0018-9340 1557-9956 |
language | eng |
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source | IEEE Xplore (Online service) |
subjects | D-algorithm functional blocks nonprocedural CHDL procedural CHDL test generation |
title | Test Generation Algorithms for Computer Hardware Description Languages |
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