Loading…
Sol-gel lead zirconate-titanate thin films: effect of solution concentration
The microstructure development in lead zirconate titanate (PZT) compositions near the morphotropic phase boundary, PZT (50 PT/50 PZ) and PNZT (2 Nb/sub 2/O/sub 5//53 PT/45 PZ), has been investigated by scanning electron microscopy (SEM), optical microscopy, and X-ray diffraction analysis (XRD). The...
Saved in:
Main Authors: | , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 447 |
container_issue | |
container_start_page | 444 |
container_title | |
container_volume | |
creator | Livage, C. Safari, A. Klein, L.C. |
description | The microstructure development in lead zirconate titanate (PZT) compositions near the morphotropic phase boundary, PZT (50 PT/50 PZ) and PNZT (2 Nb/sub 2/O/sub 5//53 PT/45 PZ), has been investigated by scanning electron microscopy (SEM), optical microscopy, and X-ray diffraction analysis (XRD). The molar concentration of the precursor alkoxide solution has been increased to 0.75-M from the concentration of around 0.20M used in previous studies. Thin films have been fabricated by spin coating Pt/Ti/SiO/sub 2//Si substrates with the alkoxide solution. It is found that, in the solutions with high molar concentrations, the perovskite phase forms at lower temperatures than found previously in dilute solutions. In addition, the microstructure of the films is dense and uniform, showing none of the spherulites found previously.< > |
doi_str_mv | 10.1109/ISAF.1992.300596 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_300596</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>300596</ieee_id><sourcerecordid>300596</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-861d675ffecc8c05e3e45503cc1994a8834c276e407a774b8731dbf80edc975b3</originalsourceid><addsrcrecordid>eNotT8FKxDAUDIiwsva-eMoPtL40SZN4WxZXFwoeVs9Lmr5oJNtKEw_69basw8CbgWF4Q8iGQcUYmPvDcbuvmDF1xQGkaa5IYZSGmRxEI82KFCl9wgwhwdTmhrTHMZbvGGlE29PfMLlxsBnLHLJdBM0fYaA-xHN6oOg9ukxHT9MYv3MYBzrHHQ55sou7JdfexoTF_12Tt_3j6-65bF-eDrttWwam6lzqhvWNkkuZ0w4kchRSAndufl1YrblwtWpQgLJKiU4rzvrOa8DeGSU7viZ3l96AiKevKZzt9HO6TOZ_QHZMgg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Sol-gel lead zirconate-titanate thin films: effect of solution concentration</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Livage, C. ; Safari, A. ; Klein, L.C.</creator><creatorcontrib>Livage, C. ; Safari, A. ; Klein, L.C.</creatorcontrib><description>The microstructure development in lead zirconate titanate (PZT) compositions near the morphotropic phase boundary, PZT (50 PT/50 PZ) and PNZT (2 Nb/sub 2/O/sub 5//53 PT/45 PZ), has been investigated by scanning electron microscopy (SEM), optical microscopy, and X-ray diffraction analysis (XRD). The molar concentration of the precursor alkoxide solution has been increased to 0.75-M from the concentration of around 0.20M used in previous studies. Thin films have been fabricated by spin coating Pt/Ti/SiO/sub 2//Si substrates with the alkoxide solution. It is found that, in the solutions with high molar concentrations, the perovskite phase forms at lower temperatures than found previously in dilute solutions. In addition, the microstructure of the films is dense and uniform, showing none of the spherulites found previously.< ></description><identifier>ISBN: 9780780304659</identifier><identifier>ISBN: 0780304659</identifier><identifier>DOI: 10.1109/ISAF.1992.300596</identifier><language>eng</language><publisher>IEEE</publisher><subject>Electron optics ; Microstructure ; Niobium ; Optical diffraction ; Optical films ; Optical microscopy ; Scanning electron microscopy ; Titanium compounds ; Transistors ; X-ray diffraction</subject><ispartof>ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics, 1992, p.444-447</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/300596$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/300596$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Livage, C.</creatorcontrib><creatorcontrib>Safari, A.</creatorcontrib><creatorcontrib>Klein, L.C.</creatorcontrib><title>Sol-gel lead zirconate-titanate thin films: effect of solution concentration</title><title>ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics</title><addtitle>ISAF</addtitle><description>The microstructure development in lead zirconate titanate (PZT) compositions near the morphotropic phase boundary, PZT (50 PT/50 PZ) and PNZT (2 Nb/sub 2/O/sub 5//53 PT/45 PZ), has been investigated by scanning electron microscopy (SEM), optical microscopy, and X-ray diffraction analysis (XRD). The molar concentration of the precursor alkoxide solution has been increased to 0.75-M from the concentration of around 0.20M used in previous studies. Thin films have been fabricated by spin coating Pt/Ti/SiO/sub 2//Si substrates with the alkoxide solution. It is found that, in the solutions with high molar concentrations, the perovskite phase forms at lower temperatures than found previously in dilute solutions. In addition, the microstructure of the films is dense and uniform, showing none of the spherulites found previously.< ></description><subject>Electron optics</subject><subject>Microstructure</subject><subject>Niobium</subject><subject>Optical diffraction</subject><subject>Optical films</subject><subject>Optical microscopy</subject><subject>Scanning electron microscopy</subject><subject>Titanium compounds</subject><subject>Transistors</subject><subject>X-ray diffraction</subject><isbn>9780780304659</isbn><isbn>0780304659</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1992</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotT8FKxDAUDIiwsva-eMoPtL40SZN4WxZXFwoeVs9Lmr5oJNtKEw_69basw8CbgWF4Q8iGQcUYmPvDcbuvmDF1xQGkaa5IYZSGmRxEI82KFCl9wgwhwdTmhrTHMZbvGGlE29PfMLlxsBnLHLJdBM0fYaA-xHN6oOg9ukxHT9MYv3MYBzrHHQ55sou7JdfexoTF_12Tt_3j6-65bF-eDrttWwam6lzqhvWNkkuZ0w4kchRSAndufl1YrblwtWpQgLJKiU4rzvrOa8DeGSU7viZ3l96AiKevKZzt9HO6TOZ_QHZMgg</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>Livage, C.</creator><creator>Safari, A.</creator><creator>Klein, L.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1992</creationdate><title>Sol-gel lead zirconate-titanate thin films: effect of solution concentration</title><author>Livage, C. ; Safari, A. ; Klein, L.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-861d675ffecc8c05e3e45503cc1994a8834c276e407a774b8731dbf80edc975b3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Electron optics</topic><topic>Microstructure</topic><topic>Niobium</topic><topic>Optical diffraction</topic><topic>Optical films</topic><topic>Optical microscopy</topic><topic>Scanning electron microscopy</topic><topic>Titanium compounds</topic><topic>Transistors</topic><topic>X-ray diffraction</topic><toplevel>online_resources</toplevel><creatorcontrib>Livage, C.</creatorcontrib><creatorcontrib>Safari, A.</creatorcontrib><creatorcontrib>Klein, L.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Livage, C.</au><au>Safari, A.</au><au>Klein, L.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sol-gel lead zirconate-titanate thin films: effect of solution concentration</atitle><btitle>ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics</btitle><stitle>ISAF</stitle><date>1992</date><risdate>1992</risdate><spage>444</spage><epage>447</epage><pages>444-447</pages><isbn>9780780304659</isbn><isbn>0780304659</isbn><abstract>The microstructure development in lead zirconate titanate (PZT) compositions near the morphotropic phase boundary, PZT (50 PT/50 PZ) and PNZT (2 Nb/sub 2/O/sub 5//53 PT/45 PZ), has been investigated by scanning electron microscopy (SEM), optical microscopy, and X-ray diffraction analysis (XRD). The molar concentration of the precursor alkoxide solution has been increased to 0.75-M from the concentration of around 0.20M used in previous studies. Thin films have been fabricated by spin coating Pt/Ti/SiO/sub 2//Si substrates with the alkoxide solution. It is found that, in the solutions with high molar concentrations, the perovskite phase forms at lower temperatures than found previously in dilute solutions. In addition, the microstructure of the films is dense and uniform, showing none of the spherulites found previously.< ></abstract><pub>IEEE</pub><doi>10.1109/ISAF.1992.300596</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 9780780304659 |
ispartof | ISAF '92: Proceedings of the Eighth IEEE International Symposium on Applications of Ferroelectrics, 1992, p.444-447 |
issn | |
language | eng |
recordid | cdi_ieee_primary_300596 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Electron optics Microstructure Niobium Optical diffraction Optical films Optical microscopy Scanning electron microscopy Titanium compounds Transistors X-ray diffraction |
title | Sol-gel lead zirconate-titanate thin films: effect of solution concentration |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T14%3A45%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Sol-gel%20lead%20zirconate-titanate%20thin%20films:%20effect%20of%20solution%20concentration&rft.btitle=ISAF%20'92:%20Proceedings%20of%20the%20Eighth%20IEEE%20International%20Symposium%20on%20Applications%20of%20Ferroelectrics&rft.au=Livage,%20C.&rft.date=1992&rft.spage=444&rft.epage=447&rft.pages=444-447&rft.isbn=9780780304659&rft.isbn_list=0780304659&rft_id=info:doi/10.1109/ISAF.1992.300596&rft_dat=%3Cieee_6IE%3E300596%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i172t-861d675ffecc8c05e3e45503cc1994a8834c276e407a774b8731dbf80edc975b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=300596&rfr_iscdi=true |