Programmable deterministic Built-In Self-Test

• Main Authors: Hakmi, A.-W., Wunderlich, H.-J., Zoellin, C.G., Glowatz, A., Hapke, F., Schloeffel, J., Souef, L.
• Format: Conference Proceeding
• Language: English
• Subjects: Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Deterministic BIST; Equations; Hardware; Linear feedback shift registers; Logic testing; Semiconductor device testing; Test data compression
• ISSN: 1089-3539; 2378-2250
• DOI: 10.1109/TEST.2007.4437611

In this paper, we propose a new programmable deterministic built-in self-Test (BIST) method that requires significantly lower storage for deterministic patterns than existing programmable methods and provides high flexibility for test engineering in both internal and external test. Theoretical analysis suggests that significantly more care bits can be encoded in the seed of a linear feedback shift register (LFSR), if a limited number of conflicting equations is ignored in the employed linear equation system. The ignored care bits are separately embedded into the LFSR pattern. In contrast to known deterministic BIST schemes based on test set embedding, the embedding logic function is not hardwired. Instead, this information is stored in memory using a special compression and decompression method. Experiments for benchmark circuits and industrial designs demonstrate that the approach has considerably higher overall coding efficiency than the existing methods.