Physical-based characterization of low frequency responses in metal-oxide gas sensors

The noise level in the gas microsensors is a tool for characterizing the electrical conduction under various gases and a means to improve selectivity. Metal-oxide gas microsensors with WO 3 sensitive thin film have been characterized using a low frequency noise technique. The spectral form of the no...

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Bibliographic Details
Main Authors: Contaret, T., Seguin, J., Aguir, K.
Format: Conference Proceeding
Language:English
Subjects:
Current measurement
Gas detectors
Gases
Microsensors
Noise
Noise measurement
Online Access:Request full text
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Summary:The noise level in the gas microsensors is a tool for characterizing the electrical conduction under various gases and a means to improve selectivity. Metal-oxide gas microsensors with WO 3 sensitive thin film have been characterized using a low frequency noise technique. The spectral form of the noise responses measured using our specific systems is similar for tested gases (ozone and nitrogen dioxide). We observe a clear Lorentzian behavior according to adsorption-desorption (A-D) noise theory. To identify the detected gas, a physical-based characterization model of A-D noise source is proposed and compared with the empirical flicker noise model. We show that the excess noise is due to the A-D processes on the surface of the sensors sensitive film. The Lorentzian parameters depend on the nature of the gases and the noise level dependence with gas concentration is clearly demonstrated. This confirms the interest of noise spectroscopy to improve the selectivity of gas sensors.
ISSN:1930-0395
2168-9229
DOI:10.1109/ICSENS.2011.6127016