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Employing Nanoscale Surface Characterizations in a Field Emission Model

This work presents a model for field-induced electron emission at the mesoscale using information from experimentally measured nanoscale features. Many models used in PIC-DSMC simulations for field-induced electron emission from a surface employ a Fowler-Nordheim current density formulation. This fo...

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Bibliographic Details
Main Authors: Hopkins, Matthew M., Jindal, Ashish K., Bussmann, Ezra, Ohta, Taisuke, Berg, Morgann, Thomas, Cherrelle, Scrymgeour, David, Clem, Paul G., Moore, Christopher H.
Format: Conference Proceeding
Language:English
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Summary:This work presents a model for field-induced electron emission at the mesoscale using information from experimentally measured nanoscale features. Many models used in PIC-DSMC simulations for field-induced electron emission from a surface employ a Fowler-Nordheim current density formulation. This formulation includes a "geometric field enhancement factor", \beta=E_{\text{surf}}/E_{\text{app}}(E_{\text{surf}}=\text{surface} normal field, E_{\text{app}}=\text{bulk} applied field), which is usually fit to experimental data for the underlying application. To fit experimentally measured currents from "normal, realistic" surfaces, \beta can sometimes take on very large values (\sim 1000) ; however, upon inspecting these surfaces no such \text{high}-\beta features are found. To better understand the variation in field-induced electron emission we have developed a mesoscale model for emission based on \beta and work function \varphi distributions as measured via microscopy techniques.
ISSN:2576-7208
DOI:10.1109/ICOPS37625.2020.9717571