The influence of chirality on the difference in flexoelectric coefficients investigated in uniform lying helix, Grandjean and twisted nematic structures

Measurements of the difference in flexoelectric coefficients (e 1 - e 3 ), using the sign convention as originally defined by Meyer, are reported from three experiments employing the flexoelectro-optic effect in different geometries. The uniform lying helix (ULH) structure is used to measure the til...

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Bibliographic Details
Published in:Liquid crystals 2009-12, Vol.36 (12), p.1355-1364
Main Authors: Salter, P. S., Kischka, C., Elston, S. J., Raynes, E. P.
Format: Article
Language:English
Subjects:
chirality
Crystals
Electric fields
Experiments
flexoelectricity
Measurement techniques
nematic
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Summary:Measurements of the difference in flexoelectric coefficients (e 1 - e 3 ), using the sign convention as originally defined by Meyer, are reported from three experiments employing the flexoelectro-optic effect in different geometries. The uniform lying helix (ULH) structure is used to measure the tilt angle of the liquid crystal director with respect to the helix axis for an applied electric field, in order to infer a value for (e 1 - e 3 ). Alternatively, measurements of the flexoelectric difference can be made by considering the transmission through a device with an in-plane electric field aligned in either the Grandjean structure for highly chiral materials, or a twisted nematic (TN) structure for largely achiral materials. The results from the Grandjean and ULH structures show the equivalence of the measurement techniques with helix axis either perpendicular or parallel to the substrates. Further comparison of these results with the measurement from the achiral TN device shows that the difference in flexoelectric coefficients displays no dependence on chirality, demonstrating that flexoelectricity is purely associated with splay and bend director deformations, as expected from symmetry considerations.
ISSN:0267-8292
1366-5855
DOI:10.1080/02678290903233991