Technical Reports: A Single-photon Counting Pixel Detector for Surface Diffraction Experiments

The intense flux delivered by third-generation synchrotron sources has opened up exciting new possibilities in surface diffraction (SD) studies [1-3]. Nonetheless, practical SD experiments are plagued by several technical problems. Because the crystalline surface is typically probed down to a depth...

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Bibliographic Details
Published in:Synchrotron radiation news 2005-03, Vol.18 (2), p.16-22
Main Authors: Willmott, P. R., SchlepÜTz, C. M., Herger, R., Patterson, B. D., Bunk, O., Brönnimann, CH, Henrich, B., Hülsen, G., Eikenberry, E. F.
Format: Article
Language:English
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Summary:The intense flux delivered by third-generation synchrotron sources has opened up exciting new possibilities in surface diffraction (SD) studies [1-3]. Nonetheless, practical SD experiments are plagued by several technical problems. Because the crystalline surface is typically probed down to a depth of approximately 1 or 2 nm when using subcritical-angle incident X-ray beams, the scattering volume is only about 10 -12 cm 3 . This is further exacerbated by the fact that the most interesting information on the surface structure is generally obtained from those regions of diffraction features known as crystal truncation rods (CTRs) where scattering is weakest, i.e., in between Bragg peaks.
ISSN:0894-0886
1931-7344
DOI:10.1080/08940880500457396