Optimizing charge transport simulation for hybrid pixel detectors

To enhance the spatial resolution of the MÖNCH 25 µm pitch hybrid pixel detector, deep learning models have been trained using both simulation and measurement data. Challenges arise when comparing simulation-based deep learning models to measurement-based models for electrons, as the spatial resolut...

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Bibliographic Details
Published in:Journal of instrumentation 2024-10, Vol.19 (10), p.C10007
Main Authors: Xie, X., Barten, R., Bergamaschi, A., Braham, B., Brückner, M., Carulla, M., Dinapoli, R., Ebner, S., Ferjaoui, K., Greiffenberg, D., Hasanaj, S., Heymes, J., Hinger, V., King, T., Kozlowski, P., Lopez-Cuenca, C., Mezza, D., Moustakas, K., Mozzanica, A., Paton, K.A., Ruder, C., Schmitt, B., Sieberer, P., Thattil, D., Zhang, J., Fröjdh, E.
Format: Article
Language:English
Subjects:
Charge transport
Charge transport and multiplication in solid media
Current carriers
Deep learning
Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
Monte Carlo simulation
Pixels
Spatial resolution
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Summary:To enhance the spatial resolution of the MÖNCH 25 µm pitch hybrid pixel detector, deep learning models have been trained using both simulation and measurement data. Challenges arise when comparing simulation-based deep learning models to measurement-based models for electrons, as the spatial resolution achieved through simulations is notably inferior to that from measurements. Discrepancies are also observed when directly comparing X-ray simulations with measurements, particularly in the spectral output of single pixels. These observations collectively suggest that current simulations require optimization. To address this, the dynamics of charge carriers within the silicon sensor have been studied using Monte Carlo simulations, aiming to refine the charge transport modeling. The simulation encompasses the initial generation of the charge cloud, charge cloud drift, charge diffusion and repulsion, and electronic noise. The simulation results were validated with measurements from the MÖNCH detector for X-rays, and the agreement between measurements and simulations was significantly improved by accounting for the charge repulsion.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/19/10/C10007