Semiclassical description of photoionization microscopy

Recently, experiments have been reported where a geometrical interference pattern was observed when photoelectrons ejected in the threshold photoionization of xenon were detected in a velocity-map imaging apparatus [C. Nicole et al., Phys. Rev. Lett. 88, 133001 (2002)]. This technique, called photoi...

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Bibliographic Details
Published in:Physical review. A, Atomic, molecular, and optical physics Atomic, molecular, and optical physics, 2003-07, Vol.68 (1), Article 012709
Main Authors: Bordas, Ch, Lépine, F., Nicole, C., Vrakking, M. J. J.
Format: Article
Language:English
Subjects:
ATOMIC AND MOLECULAR PHYSICS
ATOMS
COMPUTERIZED SIMULATION
ELECTRONS
INTERFERENCE
MICROSCOPY
PHOTOIONIZATION
PHOTON-ATOM COLLISIONS
RESONANCE
SEMICLASSICAL APPROXIMATION
STARK EFFECT
XENON
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Summary:Recently, experiments have been reported where a geometrical interference pattern was observed when photoelectrons ejected in the threshold photoionization of xenon were detected in a velocity-map imaging apparatus [C. Nicole et al., Phys. Rev. Lett. 88, 133001 (2002)]. This technique, called photoionization microscopy, relies on the existence of interferences between various trajectories by which the electron moves from the atom to the plane of observation. Unlike previous predictions relevant to the hydrogenic case, the structure of the interference pattern evolves smoothly with the excess energy above the saddle point and is only weakly affected by the presence of continuum Stark resonances. In this paper, we describe a semiclassical analysis of this process and present numerical simulations in excellent agreement with the experimental results. It is shown that the background contribution dominates in the observations, as opposed to the behavior expected for hydrogenic systems where the interference pattern is qualitatively different on quasidiscrete Stark resonances.
ISSN:1050-2947
1094-1622
DOI:10.1103/PhysRevA.68.012709