Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm ∕ Hz by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can a...

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Bibliographic Details
Published in:Review of scientific instruments 2005-05, Vol.76 (5), p.053704-053704-8
Main Authors: Fukuma, Takeshi, Kimura, Masayuki, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi
Format: Article
Language:English
Subjects:
AIR
ATOMIC FORCE MICROSCOPY
BROWNIAN MOVEMENT
DENSITY
FREQUENCY MEASUREMENT
FREQUENCY MODULATION
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
LIQUIDS
MONOCRYSTALS
NOISE
PHOTON BEAMS
RESOLUTION
SENSITIVITY
WATER
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Summary:We have developed a low noise cantilever deflection sensor with a deflection noise density of 17 fm ∕ Hz by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity limited by the thermal Brownian motion of the cantilever in every environment. In this paper, the major noise sources in OBD method are discussed in both theoretical and experimental aspects. The excellent noise performance of the deflection sensor is demonstrated in deflection and frequency measurements. True molecular-resolution FM-AFM images of a polydiacetylene single crystal taken in vacuum, air, and water are presented.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1896938