Transmission electron microscopy characterization of the interfacial structure of a galvanized dual-phase steel

Site-specific studies were carried out to characterize the interface of a galvanized dual-phase (DP) steel. Focused ion beam (FIB) was used to prepare specimens in the interface region (~100nm thick) between the coating and the substrate. Transmission electron microscopy (TEM), scanning TEM (STEM),...

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Bibliographic Details
Published in:Materials characterization 2016-10, Vol.120, p.63-68
Main Authors: Aslam, I., Li, B., Martens, R.L., Goodwin, J.R., Rhee, H.J., Goodwin, F.
Format: Article
Language:English
Subjects:
Dual phase steel
Dual phase steels
Electron microscopy
Galvanizing
INHIBITION
Inhibition layer
INTERFACES
ION BEAMS
LAYERS
MANGANESE OXIDES
MATERIALS SCIENCE
Oxides
PARTICLES
RESOLUTION
SILICON OXIDES
Silicon substrates
STEELS
Structural steels
SUBSTRATES
SURFACES
THICKNESS
TRANSMISSION ELECTRON MICROSCOPY
ZINC
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Summary:Site-specific studies were carried out to characterize the interface of a galvanized dual-phase (DP) steel. Focused ion beam (FIB) was used to prepare specimens in the interface region (~100nm thick) between the coating and the substrate. Transmission electron microscopy (TEM), scanning TEM (STEM), and high resolution TEM (HRTEM) were performed to resolve the phases and the structures at the interface between the zinc (Zn) coating and the steel substrate. The STEM and TEM results showed that a continuous manganese oxide (MnO) film with a thickness of ~20nm was present on the surface of the substrate while no silicon (Si) oxides were resolved. Internal oxide particles were observed as well in the sub-surface region. Despite the presence of the continuous oxide film, a well-developed inhibition layer was observed right on top of the oxide film. The inhibition layer has a thickness of ~100nm. Possible mechanisms for the growth of the inhibition layer were discussed. •Site-specific examinations were performed on the Zn/steel interface.•Continuous external MnO oxides (20nm) were observed at the interface.•No Si oxides were observed at the interface.•Internal oxide particles were distributed in the subsurface.•A continuous inhibition layer grew on top of the external oxides.
ISSN:1044-5803
1873-4189
DOI:10.1016/j.matchar.2016.08.014