The Unoccupied Electronic States of the Ultrathin Diphenylphthalide Films on the Surface of the Highly Oriented Pyrolytic Graphite

The results of diagnostics of the atomic composition of a diphenylphthalide (DPP) film thermally precipitated in vacuum by the of X-ray photoelectric spectroscopy (XPS) method are presented. The results of examination of the unoccupied electronic states of the ultrathin DPP films with the thickness...

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Bibliographic Details
Published in:Physics of the solid state 2019-10, Vol.61 (10), p.1922-1926
Main Authors: Komolov, A. S., Lazneva, E. F., Gerasimova, N. B., Sobolev, V. S., Pshenichnyuk, S. A., Asfandiarov, N. L., Kraikin, V. A., Handke, B.
Format: Article
Language:English
Subjects:
Charge transfer
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DEPOSITION
Electron orbitals
Electron states
ELECTRONS
EV RANGE
Film thickness
GRAPHITE
MOLECULES
NANOFILMS
Photoelectricity
Physics
Physics and Astronomy
Polymers
Potential barriers
POTENTIALS
PRECIPITATION
Pyrolytic graphite
Solid State Physics
SPECTRA
Spectrum analysis
SUBSTRATES
WORK FUNCTIONS
X ray photoelectron spectroscopy
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Summary:The results of diagnostics of the atomic composition of a diphenylphthalide (DPP) film thermally precipitated in vacuum by the of X-ray photoelectric spectroscopy (XPS) method are presented. The results of examination of the unoccupied electronic states of the ultrathin DPP films with the thickness up to 10 nm on the surface of the highly oriented pyrolytic graphite (HOPG) by the total current spectroscopy (TCS) method in the energy range from 5 to 20 eV above E F are presented. In this range, the main maxima in the total current spectra are identified. The analysis of the TCS results with consideration of the theoretical calculation results has shown that the low-energy maxima observed at the energies from 6 to 7.5 eV are induced predominately by π* electron orbitals of DPP films. The values of the energy E vac in relation to E F , i.e., of the electron work function in the DPP films at the film thickness of 5–10 nm, are found experimentally at a level of 4.3 ± 0.1 eV. The negative charge transfer from an organic film to the substrate corresponds to the formation of the HOPG/DPP boundary potential barrier during the thermal deposition of the DPP film.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783419100214