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In situ Co K-edge X-ray absorption fine structure of cobalt hydroxide film electrodes in alkaline solutions
Structural and electronic properties of electrodeposited Co(OH){sub 2} films on Au electrodes in alkaline solutions have been characterized in situ by Co K-edge X-ray absorption spectroscopy (XAS). The results obtained have shown that freshly prepared films undergo spontaneous partial and irreversib...
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Published in: | Journal of the Electrochemical Society 2000-12, Vol.147 (12), p.4594-4597 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | Structural and electronic properties of electrodeposited Co(OH){sub 2} films on Au electrodes in alkaline solutions have been characterized in situ by Co K-edge X-ray absorption spectroscopy (XAS). The results obtained have shown that freshly prepared films undergo spontaneous partial and irreversible oxidation in 1 M KOH solution even when polarized at -0.58 V vs. Hg/HgO,OH{sup -}, as evidenced by the presence of contributions (ca. 20%) from Co-O and Co-Co shells in the extended X-ray absorption fine structure (EXAFS) attributed to CoOOH. Subsequent polarization of the electrode at +0.6 V oxidizes a significant fraction, but not all of the Co(OH){sub 2} into CoOOH, as judged by the occurrence of Co-O and Co-Co shells in the EXAFS ascribed to Co(OH)2. Further reduction of the same film at -0.58 V vs. Hg/HgO,OH{sup -} increased the amount of Co(OH){sub 2} from 28 to 43%, indicating that the fraction of electrochemically active sites does not exceed ca. 15%. On this basis, the redox activity of Co hydroxide is probably associated with surface rather than bulk Co{sup 2+}/Co{sup 3+} sites in the lattice. These results suggest that Co(OH){sub 2} present as a distinct pure phase in technical Ni oxide electrodes does not contribute significantly to charge storage during cycling, nor to changes in the redox properties of the electrochemically active material. |
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ISSN: | 0013-4651 1945-7111 |
DOI: | 10.1149/1.1394107 |