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Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully silicided gate applications
The Ni/polycrystalline-Si thin film reaction was monitored by in situ x-ray diffraction during ramp annealings, obtaining a detailed view of the formation and evolution of silicide phases in stacks of interest for fully silicided gate applications. Samples consisted of Ni ( 30 - 170 nm ) /polycrysta...
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Published in: | Applied physics letters 2007-10, Vol.91 (17), p.172108-172108-3 |
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Main Authors: | , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The Ni/polycrystalline-Si thin film reaction was monitored by
in situ
x-ray diffraction during ramp annealings, obtaining a detailed view of the formation and evolution of silicide phases in
stacks of interest for fully silicided gate applications. Samples consisted of Ni
(
30
-
170
nm
)
/polycrystalline-Si
(
100
nm
)
∕
Si
O
2
(
10
-
30
nm
)
stacks deposited on (100) Si. The dominant end phase (after full silicidation) was found to be well controlled by the deposited Ni to polycrystalline-Si thickness ratio
(
t
Ni
∕
t
Si
)
, with formation of
Ni
Si
2
(
∼
600
°
C
)
, NiSi
(
∼
400
°
C
)
,
Ni
3
Si
2
(
∼
500
°
C
)
,
Ni
2
Si
,
Ni
31
Si
12
(
∼
420
°
C
)
, and
Ni
3
Si
(
∼
600
°
C
)
in stacks with
t
Ni
∕
t
Si
of 0.3, 0.6, 0.9, 1.2, 1.4, and 1.7, respectively. NiSi and
Ni
31
Si
12
were observed to precede formation of
Ni
Si
2
and
Ni
3
Si
, respectively, as expected for the phase sequence conventionally reported. Formation of
Ni
2
Si
was observed at early stages of the reaction. These studies revealed, in addition, the formation of transient phases that appeared and disappeared in narrow temperature ranges, competing with formation of the phases expected in the conventional phase sequence. These included the transient formation of NiSi and
Ni
31
Si
12
in stacks in which these phases are not expected to form (e.g.,
t
Ni
∕
t
Si
of 1.7 and 0.9, respectively), at temperatures similar to those in which these phases normally grow. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.2799247 |