Low-crosstalk and low-loss waveguide crossings on InP with small dimensions

With the increasing scale of integration, resulting in a higher on-chip complexity, waveguide crossings with good performance are becoming increasingly important. Worst-case paths contain a high number of crossings, depending on the number of channels being processed, in switching matrices [11, mult...

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Bibliographic Details
Published in:Fiber and integrated optics 1997-01, Vol.16 (1), p.83-87
Main Authors: Dam, C. Van, Van Ham, F. P. G. M., Groen, F. H., Moerman, I., Van Der Tol, J. J. G. M., Smit, M. K.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
crossings
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
experiments
integrated optics
Integrated optics. Optical fibers and wave guides
modeling
Optical and optoelectronic circuits
waveguides
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Summary:With the increasing scale of integration, resulting in a higher on-chip complexity, waveguide crossings with good performance are becoming increasingly important. Worst-case paths contain a high number of crossings, depending on the number of channels being processed, in switching matrices [11, multiwavelength add drop filters [2] (up to 151, and optical cross-connects [3]. Crossings with very low crosstalk and loss can be realized in fiber-matched waveguide structures as used in lithium niobate or silica-based technology [4,5]. In highly integrated semiconductor devices, crossings may contribute significantly to the loss and crosstalk performance. In this paper we present the results of a series of experiments for the design of high-performance semiconductor waveguide crossings.
ISSN:0146-8030
1096-4681
DOI:10.1080/01468039708221258