Dose and dose-rate dependence of mutation frequency under long-term exposure - a new look at DDREF from WAM model

We have investigated the dependence of the mutation frequency on the dose and dose rate of artificial radiation using the Whack-A-Mole (WAM) model that we recently proposed. In particular, we pay special attention to the case of long-term and low-dose-rate exposure. Our results indicate that the WAM...

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Bibliographic Details
Published in:Journal of nuclear science and technology 2016-11, Vol.53 (11), p.1824-1830
Main Authors: Wada, Takahiro, Manabe, Yuichiro, Nakamura, Issei, Tsunoyama, Yuichi, Nakajima, Hiroo, Bando, Masako
Format: Article
Language:English
Subjects:
DDREF
Dependence
Dose rate
Hypotheses
LNT hypothesis
long-term exposure
mathematical model
Mutation
radiation damage
radiation protection
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Summary:We have investigated the dependence of the mutation frequency on the dose and dose rate of artificial radiation using the Whack-A-Mole (WAM) model that we recently proposed. In particular, we pay special attention to the case of long-term and low-dose-rate exposure. Our results indicate that the WAM model successfully describes the dose-rate dependence, and it can replace the so-called dose and dose-rate effectiveness factor (DDREF), which has been used for long, to account for the differences between high-dose-rate and low-dose-rate data. The basic properties of the WAM model are discussed with special emphasis on the dose-rate dependence in order to demonstrate how the dose-rate dependence, which is built into the model explicitly, plays a key role. Biological effects of long-term exposure to extremely low-dose-rate radiation are discussed in light of analysis of mega-mouse experiments using the WAM model. In the WAM model, the effects of long-term exposure show a saturation property, thus making it distinctly different from the 'linear no threshold (LNT)' hypothesis that predicts a linear increase of the effects with time.
ISSN:0022-3131
1881-1248
DOI:10.1080/00223131.2016.1164635