Challenges to miniaturizing cold atom technology for deployable vacuum metrology

Cold atoms are excellent metrological tools; they currently realize SI time and, soon, SI pressure in the ultra-high (UHV) and extreme high vacuum (XHV) regimes. The development of primary, vacuum metrology based on cold atoms currently falls under the purview of national metrology institutes. Under...

Full description

Saved in:
Bibliographic Details
Published in:Metrologia 2018-10, Vol.55 (5), p.S182-S193
Main Authors: Eckel, Stephen, Barker, Daniel S, Fedchak, James A, Klimov, Nikolai N, Norrgard, Eric, Scherschligt, Julia, Makrides, Constantinos, Tiesinga, Eite
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
cold atom sensing
Cold atoms
High vacuum
Measurement techniques
Meteorology
Metrology
Miniaturization
Quantum theory
quantum-SI
Uncertainty
Vacuum chambers
Vacuum gages
vacuum metrology
Vacuum technology
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Cold atoms are excellent metrological tools; they currently realize SI time and, soon, SI pressure in the ultra-high (UHV) and extreme high vacuum (XHV) regimes. The development of primary, vacuum metrology based on cold atoms currently falls under the purview of national metrology institutes. Under the emerging paradigm of the 'quantum-SI', these technologies become deployable (relatively easy-to-use sensors that integrate with other vacuum chambers), providing a primary realization of the pascal in the UHV and XHV for the end-user. Here, we discuss the challenges that this goal presents. We investigate, for two different modes of operation, the expected corrections to the ideal cold-atom vacuum gauge and estimate the associated uncertainties. Finally, we discuss the appropriate choice of sensor atom, the light Li atom rather than the heavier Rb.
ISSN:0026-1394
1681-7575
DOI:10.1088/1681-7575/aadbe4