Unsupervised machine learning applied to scanning precession electron diffraction data

Scanning precession electron diffraction involves the acquisition of a two-dimensional precession electron diffraction pattern at every probe position in a two-dimensional scan. The data typically comprise many more diffraction patterns than the number of distinct microstructural volume elements (e....

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Bibliographic Details
Published in:Advanced structural and chemical imaging 2019-03, Vol.5 (1), p.1-14, Article 3
Main Authors: Martineau, Ben H., Johnstone, Duncan N., van Helvoort, Antonius T. J., Midgley, Paul A., Eggeman, Alexander S.
Format: Article
Language:English
Subjects:
Artificial intelligence
Biological Microscopy
Characterization and Evaluation of Materials
Chemistry and Materials Science
Crystals
Diffraction patterns
Electron diffraction
Electrons
Machine learning
Materials Science
Methodology
Oversampling
Precession
Reduction
Spectroscopy/Spectrometry
Unsupervised learning
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Summary:Scanning precession electron diffraction involves the acquisition of a two-dimensional precession electron diffraction pattern at every probe position in a two-dimensional scan. The data typically comprise many more diffraction patterns than the number of distinct microstructural volume elements (e.g. crystals) in the region sampled. A dimensionality reduction, ideally to one representative diffraction pattern per distinct element, may then be sought. Further, some diffraction patterns will contain contributions from multiple crystals sampled along the beam path, which may be unmixed by harnessing this oversampling. Here, we report on the application of unsupervised machine learning methods to achieve both dimensionality reduction and signal unmixing. Potential artefacts are discussed and precession electron diffraction is demonstrated to improve results by reducing the impact of bending and dynamical diffraction so that the data better approximate the case in which each crystal yields a given diffraction pattern.
ISSN:2198-0926
2198-0926
DOI:10.1186/s40679-019-0063-3