Study of Silver and Copper Nanoparticles by Electron and Atomic Force Microscopy

Electron and atomic force microscopy was used to study nanosuspensions of silver (50 mg/L) and silver (85 mg/L) and copper (25 mg/L) mixtures in edible glycerin and silver and copper nanoparticles directly deposited onto a silicon substrate by ion plasma sputtering in vacuum at cathode voltages of 1...

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Bibliographic Details
Published in:Powder metallurgy and metal ceramics 2019-09, Vol.58 (5-6), p.257-264
Main Authors: Kisterska, L. D., Loginova, O. B., Lysovenko, S. O., Tkach, V. M.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Cathode sputtering
Ceramics
Characterization and Evaluation of Materials
Chemistry and Materials Science
Composites
Copper
Energy transfer
Glass
Glycerin
Glycerol
Ion plasma sputtering
Materials Science
Metallic Materials
Microscope and microscopy
Microscopy
Nanoparticles
Nanostructured Materials
Natural Materials
Silicon substrates
Silver
Single crystals
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Summary:Electron and atomic force microscopy was used to study nanosuspensions of silver (50 mg/L) and silver (85 mg/L) and copper (25 mg/L) mixtures in edible glycerin and silver and copper nanoparticles directly deposited onto a silicon substrate by ion plasma sputtering in vacuum at cathode voltages of 1000 and 1600 V. A colloidal silver sample (12 mg/L) of the NSP Company (Nature’s Sunshine Products) was studied for comparison. The samples from different batches of silver and silver–copper nanosuspensions consist of independent single-crystalline particles and their aggregates, while the NSP colloidal silver samples mainly consist of individual particles. The characteristic diameter of the particles produced directly in the sputtering process at different cathode voltages was shown to depend on energy transfer: at higher cathode voltages, the nanoparticles become coarser, but no sublattice is observed in the coarsened particles.
ISSN:1068-1302
1573-9066
DOI:10.1007/s11106-019-00076-x