Using IoT to Improve Uptime and Customer Satisfaction

One of the constant challenges facing managers in central microscopy facilities is the uptime and maintenance of their instruments. Downtime due to performance issues or repairs has a direct negative impact on the operation of the facility, from both a scientific and financial perspective. As vendor...

Full description

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2020-08, Vol.26 (S2), p.1710-1712
Main Author: Schweitzer, Marc
Format: Article
Language:English
Subjects:
Customer satisfaction
Downtime
Electron microscopy
Internet of Things
Light microscopy
Maintenance
Management and Operation of Microscopy and Microanalysis Facilities
Microscopy
Optical microscopy
X ray microscopy
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:One of the constant challenges facing managers in central microscopy facilities is the uptime and maintenance of their instruments. Downtime due to performance issues or repairs has a direct negative impact on the operation of the facility, from both a scientific and financial perspective. As vendors, we must commit ourselves to finding new, innovative, and effective ways to mitigate these issues and improve the user experience. This talk will describe one such method: an IoT (Internet of Things) system called Predictive Service used to connect to and monitor the condition of installed microscope instruments. ZEISS has deployed this system to most of their microscope modalities including Light Microscopy (LM), Electron Microscopy (EM) and X-ray Microscopy (XRM). At present, there are over 780 instruments listed worldwide.[i] Implementation of this system has revealed new opportunities and challenges for the Service organization which are being systematically addressed. Although objective data is still being collected, initial reports are promising and show a steady decrease in Mean Time To Repair (MTTR), increased uptime and improved customer satisfaction.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620019066