Thickness dependent structural and surface properties of plasma polymerized N-benzylaniline thin films

Thickness dependent structural, surface morphological, topographical and compositional studies have been done on the plasma polymerized N-benzylaniline (PPNBA) thin films, where the plasma is obtained by a parallel plate capacitively coupled glow discharge system under AC of frequency 50 Hz. From th...

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2021-04, Vol.127 (4), Article 240
Main Authors: Nasrin, Rani, Rahman, Mohammad Jellur, Jamil, A. T. M. K., Hossain, Khandker S., Bhuiyan, A. H.
Format: Article
Language:English
Subjects:
Applied physics
Characterization and Evaluation of Materials
Condensed Matter Physics
Glow discharges
Machines
Manufacturing
Materials science
Morphology
Nanotechnology
Nitrogen
Optical and Electronic Materials
Parallel plates
Physics
Physics and Astronomy
Polymerization
Processes
Surface properties
Surface roughness
Surfaces and Interfaces
Thickness
Thin Films
X ray analysis
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Summary:Thickness dependent structural, surface morphological, topographical and compositional studies have been done on the plasma polymerized N-benzylaniline (PPNBA) thin films, where the plasma is obtained by a parallel plate capacitively coupled glow discharge system under AC of frequency 50 Hz. From the X-ray diffraction studies, it is confirmed that the PPNBA thin films are amorphous in nature. The chemical structure of the PPNBA films is moderately changed from that of the monomer owing to the elimination of some benzyl groups, however, becomes conjugated due to C=C stretching of the quinoid and benzenoid units. The PPNBA films contain mostly carbon and nitrogen, which is confirmed by the energy-dispersive X-ray analysis. However, the presence of oxygen is considered to be incorporated from the reactor atmosphere. The surface morphologies of the PPBNA thin films of various thicknesses are mosaic-like structure, which is formed by the uniform distribution of unequal nanosized clusters over the smooth background of the film surface. The average roughness and root mean square roughness of the surface of the PPNBA thin films are found to be in the order of pm. The increase in the surface roughness is compatible with the increase in the cluster density, which is evidenced in the field-emission scanning electron microscopy observations.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-021-04326-x