Analyzing the Light Elements in an Electron Probe Micro Analyzer

Wavelength-dispersive analysis of the ultra-light elements boron, carbon, nitrogen, and oxygen requires much more complicated experimental procedures than the analysis of medium-to-high Z (Z >11) elements. For a large part this is the result of a number of fundamental physical problems which cann...

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Bibliographic Details
Published in:Microscopy and microanalysis 1998-07, Vol.4 (S2), p.220-221
Main Authors: Bastin, G.F., Heijligers, H.J.M.
Format: Article
Language:English
Subjects:
Boron
Electron probe
Electron probes
Electron transitions
Emission
Light elements
Problem Elements and Spectrometry Problems in X-Ray Microanalysis
Shape effects
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Summary:Wavelength-dispersive analysis of the ultra-light elements boron, carbon, nitrogen, and oxygen requires much more complicated experimental procedures than the analysis of medium-to-high Z (Z >11) elements. For a large part this is the result of a number of fundamental physical problems which cannot be circumvented. The most difficult problems of this nature are those related to the differences in the x-ray emission profiles from one ultra-light element compound to another. These differences are caused by the fact that in exciting ultra-light element x-rays electronic transitions of the bonding electrons are involved. As a consequence one has to deal with large peak shifts and large peak shape alterations in WDS analysis of ultra-light elements. While peak shifts can easily be accounted for by simply retuning the spectrometer when moving from standard to specimen the effects of peak shape alterations are much more difficult to deal with and in general it is imperative to perform the intensity measurements in an integral fashion.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760002122X