Determination of optical constants and scattering properties of transparent polymers for use in optoelectronics

Knowledge of optical constants, i.e. refractive index n and extinction coefficient k , and light scattering properties of optical polymers are required to optimize micro-optics for light-emitting diodes in terms of efficiency, color properties and light distribution. We present here a model-based di...

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Bibliographic Details
Published in:Optical materials express 2022-01, Vol.12 (1), p.204
Main Authors: Bauer, Joachim, Fursenko, Oksana, Heinrich, Friedhelm, Gutke, Marko, Kornejew, Eckhart, Broedel, Oliver, Dietzel, Birgit, Kaltenbach, Alexander, Burkhardt, Martin, Edling, Matthias, Steglich, Patrick, Herzog, Michael, Schrader, Sigurd
Format: Article
Language:English
Subjects:
Atomic force microscopy
Critical point
Diffraction
Diffraction theory
Excitons
Inhomogeneity
Light distribution
Light emitting diodes
Mechanical properties
Micro-optics
Microscopes
Mie scattering
Optical properties
Optical transition
Optoelectronics
Polymers
Refractivity
Scattering coefficient
Surface roughness
Wave reflection
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Summary:Knowledge of optical constants, i.e. refractive index n and extinction coefficient k , and light scattering properties of optical polymers are required to optimize micro-optics for light-emitting diodes in terms of efficiency, color properties and light distribution. We present here a model-based diagnostic approach to determine the optical properties of polymers, which should be particularly useful in the development of plastics for optical applications. Optical constants and scattering coefficients were obtained from transmission and reflection measurements in a wavelength range from UV to NIR taking into account scattering effects due to rough surfaces and volume inhomogeneity. Based on the models for the dielectric function, the molecular optical transition energies E g , critical point energies, Urbach energies and exciton transition energies were determined. Rayleigh and Mie scattering model and van de Hulst's anomalous diffraction theory were applied to characterize scattering due to volume inhomogeneities. Scalar diffraction theory was applied to account for surface roughness scattering. Atomic force microscopy with nanomechanical characterization was used to characterize domains in size and shape and to assign optical scattering to a suitable morphological model. The combined optical and mechanical characterization help to improve the qualification of new polymer materials for optical applications.
ISSN:2159-3930
2159-3930
DOI:10.1364/OME.434715