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Enhancement of SSVEPs Classification in BCI-Based Wearable Instrumentation Through Machine Learning Techniques
This work addresses the adoption of Machine Learning classifiers and Convolutional Neural Networks to improve the performance of highly wearable, single-channel instrumentation for Brain-Computer Interfaces. The proposed measurement system is based on the classification of Steady- State Visually Evo...
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Published in: | IEEE sensors journal 2022-05, Vol.22 (9), p.9087-9094 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This work addresses the adoption of Machine Learning classifiers and Convolutional Neural Networks to improve the performance of highly wearable, single-channel instrumentation for Brain-Computer Interfaces. The proposed measurement system is based on the classification of Steady- State Visually Evoked Potentials (SSVEPs). In particular, Head-Mounted Displays for Augmented Reality are used to generate and display the flickering stimuli for the SSVEPs elicitation. Four experiments were conducted by employing, in turn, a different Head-Mounted Display. For each experiment, two different algorithms were applied and compared with the state-of-the-art-techniques. Furthermore, the impact of different Augmented Reality technologies in the elicitation and classification of SSVEPs was also explored. The experimental metrological characterization demonstrates (i) that the proposed Machine Learning-based processing strategies providea significantenhancement of theSSVEPclassification accuracy with respect to the state of the art, and (ii) that choosing an adequate Head-Mounted Display is crucial to obtain acceptable performance. Finally, it is also shown that the adoption of inter-subjective validation strategies such as the Leave-One-Subject-Out Cross Validation successfully leads to an increase in the inter-individual 1- \sigma reproducibility: this, in turn, anticipates an easier development of ready-to-use systems. |
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ISSN: | 1530-437X 1558-1748 |
DOI: | 10.1109/JSEN.2022.3161743 |